| | EPA uses a variety of AMSAR equipment to test solids:
| Atomic Force Microscope (AFM) |
| The AFM is used to analyze biological samples, membranes, powders, and solids, as well as synthetic solids. Its functions include determining the magnetic properties of a sample, measuring the reactivity of a surface, and viewing biological membranes. |
 |
Top of page
| Carbon-Sulfur Analyzer |
| With the carbon-sulfur analyzer, researchers can look at solid samples with total masses of less than 0.1 gram. The analyzer can measure total carbon (inorganic and organic) and total sulfur (sulfate, sulfide, and organic) in solid samples. |
 |
Top of page
| Coulometric Carbon Analyzer |
| This analyzer is used to measure the total inorganic carbon content of solids and liquids. |
 |
Top of page
| Cross-Section Polisher |
| The JEOL cross-section polisher uses argon to produce an ion beam that sweeps the surface of the sample being polished. This is a nonmechanical means of polishing the cross-sectional face of a sample. The result is a highly polished face on which even the finest details of the sample have been preserved. It is used primarily for delicate samples that may tear away or that tend to smear with mechanical polishing. |
Top of page
| Light/Stereo Microscope |
| The light-stereo microscope allows researchers to view the structures of living cells, minerals, corroded metals, semiconductors, and many other materials by using either light or dark microscopy methods. |
 |
Top of page
Scanning Electron Microscope (SEM)
with Energy Dispersive Spectroscopy (EDS) |
| The JEOL 5800LV scanning electron microscope with an Oxford EDS is used to perform structural and elemental analysis on vacuum-compatible solids, bulk materials, fibers, powders, and biological samples. Samples that are nonconductive must be coated with conductive materials, such as gold or carbon, before being viewed, or the samples may be viewed on a low-vacuum setting to reduce electron charging of the sample. Ultimately, the SEM with EDS helps researchers identify surface structures and the elemental composition of micron-sized features. |
 |
Top of page
Scanning Electron Microscope (SEM)
with Wavelength Dispersive Spectroscopy (WDS) |
| Because of its versatility and the wide range of information it can provide, the scanning electron microscope is often the preferred starting tool for analytical microscopy. With a SEM, a focused beam of high-energy electrons is scanned over the surface of a material. The electron beam interacts with the material, causing a variety of signals—secondary electrons, backscattered electrons, X-rays, photons, etc.—each of which may be used to characterize a material with respect to specific properties. The signals are used to modulate the brightness on a display cathode ray tube, thereby providing a high-resolution map of the selected material property.
The JEOL 6490LV SEM is enhanced with a WDS, as well as with a high-throughput analytical drift detector for electron dispersive spectroscopy (EDS). These spectrometers allow the simultaneous collection of elemental data and provide a finer resolution of light and trace elements. This powerful system helps researchers to characterize finer details of samples and sample composition. |
Top of page
| Sample Preparation Equipment |
| Sample preparation equipment includes saws, sanding equipment, ball mills, hydraulic presses, mortars and pestles, and sieves needed to encapsulate solid specimens. |
 |
Top of page
| Solids Carbon Analyzer |
| The solids carbon analyzer is used to measure the total organic and inorganic carbon content of solids. |
 |
Top of page
| Transmission Electron Microscope (TEM) |
| Researchers use the JEOL 1200EX II TEM to analyze nanoparticles, thin films, and biological specimens. With this microscope, they can determine the morphology and chemical composition of particles, investigate defective structures and interactions, and view the ultra-structure of biological and material samples. |
 |
Top of page
| X-Ray Fluorescence (XRF) Analyzer |
| The XRF is used to analyze pressed powders of solid materials. Researchers use this analyzer to conduct quantitative elemental analysis of a sample. Qualitative elemental scans can also be performed on flat or powdered samples. |
 |
Top of page
| Zetasizer Analyzer |
| The zetasizer allows researchers to analyze suspended particles and microbes in liquid. Researchers can determine the charge of an ion in a sample and investigate how ions will interact with or repel other ions. |
 |
|
![[logo] US EPA](http://www.epa.gov/epafiles/images/logo_epaseal.gif){kind=logo}